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Search: "[ keyword: Failure rate ]" (2)
The Effect of Series and Shunt Redundancy on Power Semiconductor Reliability
Mohsen Hasan Babayi Nozadian  Mohammad Shadnam Zarbil  Mehdi Abapour
Vol. 16, No. 4, pp. 1426-1437, Jul. 2016
10.6113/JPE.2016.16.4.1426
Reliability: A Neglected Topic in the Power Electronics Curricula
Hugo Calleja  Freddy Chan
Vol. 10, No. 6, pp. 660-666, Nov. 2010
10.6113/JPE.2010.10.6.660

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  ISSN : 1598 - 2092
eISSN : 2093 - 4718